TY  - RPRT
TI  - Electron escape probability in high-efficiency photocathodes measured by reverse-injection photovoltage
AU  - S. A. Rozhkov
AU  - D. A. Kustov
AU  - V. V. Bakin
AU  - V. S. Khoroshilov
AU  - V. L. Alperovich
AU  - O. E. Tereshchenko
AU  - H. E. Scheibler
PY  - 2026
UR  - https://arxiv.org/abs/2607.18420
ID  - 2607.18420
ER  -