TY  - RPRT
TI  - Hardness and Complexity Transition of Noisy Random Circuit Sampling
AU  - Byeongseon Go
AU  - Changhun Oh
AU  - Hyunseok Jeong
PY  - 2026
UR  - https://arxiv.org/abs/2607.20804
ID  - 2607.20804
ER  -