@misc{indiciae89982fb768b1,
  title = {Reliability-Aware Bayesian Optimization of 1310 nm PCSELs with FDTD Verification},
  author = {Jinglin Yu and Feiyang Wu and Longying Wen and Chongxian Yuan and Renjie Li and Zhaoyu Zhang},
  year = {2026},
  url = {https://arxiv.org/abs/2607.21772},
  note = {Source identifier: 2607.21772}
}