TY  - RPRT
TI  - SPARC: Automated Root-Cause Analysis of Pre-Silicon Power Side-Channel Leakage in the Processor Design Flow
AU  - Andrija Nešković
AU  - Christian Ewert
AU  - Mladen Berekovic
AU  - Saleh Mulhem
PY  - 2026
DO  - 10.1145/3831252.3834007
UR  - https://arxiv.org/abs/2607.23218
ID  - 2607.23218
ER  -