TY  - RPRT
TI  - Dynamic Multi-Criteria Bottleneck Severity Index (DMBSI) for Semiconductor Wafer Manufacturing: A Genetically Optimised Framework for Reentrant Production Systems
AU  - Mohammad Sharifur Rahman
AU  - Karl McCreadie
AU  - Saugat Bhattacharyya
AU  - M M Manjurul Islam
AU  - Cormac McAteer
AU  - Bryan John Baker
AU  - Nuala Parker
AU  - Girijesh Prasad
PY  - 2026
UR  - https://arxiv.org/abs/2607.24819
ID  - 2607.24819
ER  -