@misc{indiciae69663355fbc7,
  title = {On the static dielectric constant of thin dielectrics in extremely scaled silicon nanosheet transistors},
  author = {Massimo V. Fischetti and Dallin O. Nielsen and Edward Chen},
  year = {2026},
  url = {https://arxiv.org/abs/2607.26328},
  note = {Source identifier: 2607.26328}
}