TY  - RPRT
TI  - On the static dielectric constant of thin dielectrics in extremely scaled silicon nanosheet transistors
AU  - Massimo V. Fischetti
AU  - Dallin O. Nielsen
AU  - Edward Chen
PY  - 2026
UR  - https://arxiv.org/abs/2607.26328
ID  - 2607.26328
ER  -