@misc{indiciaed060a198bdfb,
  title = {A New Approach to Goodness of Fit for Ergodic Markov Processes},
  author = {Vance Martin and Yoshihiko Nishiyama and John Stachurski and Yiran Xie},
  year = {2026},
  url = {https://arxiv.org/abs/2608.03088},
  note = {Source identifier: 2608.03088}
}