TY  - RPRT
TI  - A New Approach to Goodness of Fit for Ergodic Markov Processes
AU  - Vance Martin
AU  - Yoshihiko Nishiyama
AU  - John Stachurski
AU  - Yiran Xie
PY  - 2026
UR  - https://arxiv.org/abs/2608.03088
ID  - 2608.03088
ER  -