TY  - RPRT
TI  - Picometre-scale real-time drift correction in TEM and STEM by dynamic control of the specimen stage for atomic-resolution imaging
AU  - Christophe Gatel
AU  - Julien Dupuy
AU  - Teresa Hungria
AU  - Martin J. Hytch
PY  - 2026
UR  - https://arxiv.org/abs/2608.03344
ID  - 2608.03344
ER  -