@misc{indiciaec65b75aa2267,
  title = {Precision Specimen Positioning in Electron Microscopy through Hysteresis Compensation, Iterative Learning, and Vision-Based Sensing},
  author = {J. S. van Hulst and A. M. C. de Peffer and D. Herceg and E. M. Franken and E. Verschueren and W. P. M. H. Heemels and D. J. Antunes},
  year = {2026},
  url = {https://arxiv.org/abs/2608.03669},
  note = {Source identifier: 2608.03669}
}