TY  - RPRT
TI  - Precision Specimen Positioning in Electron Microscopy through Hysteresis Compensation, Iterative Learning, and Vision-Based Sensing
AU  - J. S. van Hulst
AU  - A. M. C. de Peffer
AU  - D. Herceg
AU  - E. M. Franken
AU  - E. Verschueren
AU  - W. P. M. H. Heemels
AU  - D. J. Antunes
PY  - 2026
UR  - https://arxiv.org/abs/2608.03669
ID  - 2608.03669
ER  -