TY  - RPRT
TI  - Process-fracture mapping of a DLP-printed photopolymer using Bayesian active learning and surrogate-based sensitivity analysis
AU  - Ethan Blackwell
AU  - Yogesh C. Chandrashekar
AU  - Guoqiang Li
AU  - Kshitiz Upadhyay
PY  - 2026
UR  - https://arxiv.org/abs/2608.11594
ID  - 2608.11594
ER  -