@misc{indiciaedabffa59b8da,
  title = {Forward and Inverse Virtual Metrology for Phototransistor Gain: A Hierarchical, Uncertainty-Aware Approach for Small Production Datasets},
  author = {Mahshid Amirabgir and Lorenza Ferrario and Paolo Conci and Mahdieh Amirabgir and Giancarlo Orengo},
  year = {2026},
  url = {https://arxiv.org/abs/2608.11868},
  note = {Source identifier: 2608.11868}
}