TY  - RPRT
TI  - Forward and Inverse Virtual Metrology for Phototransistor Gain: A Hierarchical, Uncertainty-Aware Approach for Small Production Datasets
AU  - Mahshid Amirabgir
AU  - Lorenza Ferrario
AU  - Paolo Conci
AU  - Mahdieh Amirabgir
AU  - Giancarlo Orengo
PY  - 2026
UR  - https://arxiv.org/abs/2608.11868
ID  - 2608.11868
ER  -