TY  - RPRT
TI  - TCAD Cryogenic Model Parameters Calibration based on 65 nm NMOS Experimental Data
AU  - Wesley Xi
AU  - Vikram Magendar
AU  - Alhaji A Sharka
AU  - Hiu Yung Wong
PY  - 2026
UR  - https://arxiv.org/abs/2608.12692
ID  - 2608.12692
ER  -