TY  - RPRT
TI  - Thickness-dependent secondary-electron emission from suspended MoS$_2$ membranes in the helium ion microscope
AU  - Cyan Kim
AU  - David Lister
AU  - Philip Jackle
AU  - Karen L. Kavanagh
PY  - 2026
UR  - https://arxiv.org/abs/2608.13688
ID  - 2608.13688
ER  -