@misc{indiciae6d96afd3f217,
  title = {Disorder signatures emerging at millikelvin temperatures in Si/SiGe field-effect stacks},
  author = {Lino Visser and Alberto Mistroni and Yuji Yamamoto and Fabian Fidorra and Oksana Fursenko and Steffen Marschmeyer and Marvin H. Zoellner and Giovanni Capellini and Dominique Bougeard and Vincent Mourik and Marco Lisker and Felix Reichmann},
  year = {2026},
  url = {https://arxiv.org/abs/2608.14224},
  note = {Source identifier: 2608.14224}
}