TY  - RPRT
TI  - Continuity-Driven Representation Learning for Industrial Defect Detection
AU  - Minjong Kim
AU  - Hyun Jun Kim
AU  - Jeongrae Kim
AU  - Heeseung Shin
AU  - Changwon Lim
PY  - 2026
UR  - https://arxiv.org/abs/2608.17362
ID  - 2608.17362
ER  -