@misc{indiciaecdda38022512,
  title = {Carrier Capture at Defects from Finite-Temperature Lattice Dynamics},
  author = {Menglin Huang and Shanshan Wang and Shiyou Chen},
  year = {2026},
  url = {https://arxiv.org/abs/2608.20491},
  note = {Source identifier: 2608.20491}
}