@misc{indiciae7402463496ca,
  title = {Cross-Layer Analysis of Thermal Tuning Stalls in Wafer-Scale Optical Interconnects for LLM MoE Training},
  author = {Seongwon Yoon and Pin-Jun Chen and Shimeng Yu},
  year = {2026},
  url = {https://arxiv.org/abs/2608.24637},
  note = {Source identifier: 2608.24637}
}