TY  - RPRT
TI  - Cross-Layer Analysis of Thermal Tuning Stalls in Wafer-Scale Optical Interconnects for LLM MoE Training
AU  - Seongwon Yoon
AU  - Pin-Jun Chen
AU  - Shimeng Yu
PY  - 2026
UR  - https://arxiv.org/abs/2608.24637
ID  - 2608.24637
ER  -