TY  - RPRT
TI  - Measuring and Modelling Lag in Amorphous Silicon Flat-Panel X-ray Detectors
AU  - Yiyue Huang
AU  - Benjamin Young
AU  - Andrew Kingston
AU  - Adrian Sheppard
PY  - 2026
UR  - https://arxiv.org/abs/2608.26542
ID  - 2608.26542
ER  -