TY  - RPRT
TI  - Atomic-scale composition of the ternary III-V semiconductor (Al,Ga)Sb visualized by cross-sectional scanning tunneling microscopy
AU  - Hitesh Kumar
AU  - Vladimir Kaganer
AU  - Zijin Lei
AU  - Rüdiger Schott
AU  - Werner Wegscheider
AU  - Stefan Fölsch
PY  - 2026
UR  - https://arxiv.org/abs/2608.27013
ID  - 2608.27013
ER  -