TY  - RPRT
TI  - Extending the operating window of scanning electron microscopy through an integrated electron-optical architecture for high-temperature and near-ambient-pressure environments
AU  - Yue Chai
AU  - Honglong Zhao
AU  - Xinning Tian
AU  - Chao Ang
AU  - Zhu-Jun Wang
PY  - 2026
UR  - https://arxiv.org/abs/2608.27858
ID  - 2608.27858
ER  -