TY  - RPRT
TI  - Wafer-Level 1/f Noise Characterization of Scaled P-Type Nanosheets and Comparison with Planar HKMG Transistors
AU  - Ruben Asanovski
AU  - Anabela Veloso
AU  - Ben Kaczer
AU  - Naoto Horiguchi
AU  - Jacopo Franco
PY  - 2026
DO  - 10.1109/irps61424.2026.11499170
UR  - https://arxiv.org/abs/2609.08674
ID  - 2609.08674
ER  -