@misc{indiciaeba54656d5a70,
  title = {Physics-aware global Rietveld refinement for high-energy X-ray diffraction microscopy with application to reconstructing intragranular orientation and strain fields},
  author = {Carter K. Cocke and Eitan Camacho and Sara F. Gorske and Katherine T. Faber and Kaushik Bhattacharya},
  year = {2026},
  url = {https://arxiv.org/abs/2609.13619},
  note = {Source identifier: 2609.13619}
}