@misc{indiciae65d5d46b4049,
  title = {Prescreening Point Defects in Semiconductors With Machine Learning},
  author = {Paul Karlsson and Joel Davidsson and Rickard Armiento},
  year = {2026},
  url = {https://arxiv.org/abs/2609.14846},
  note = {Source identifier: 2609.14846}
}