@misc{indiciae9ff58c042661,
  title = {Experiments and Modeling of Defect Dynamics and BTI Behavior in Doped InO TFTs during \$400\textasciicircum{}\textbackslash{}circ\$C Post-Processing Forming Gas Annealing},
  author = {Yu-Hsin Kuo and Chengyang Zhang and Priyankka Ravikumar and Sanghyun Kang and Taeyoung Song and Marco Villena and Luca Larcher and Hwan Kim and Minji Hong and Pilsang Yun and Gaurav Thareja and Shimeng Yu and Daewon Ha and Suman Datta and Julia Medvedeva and Asif Khan},
  year = {2026},
  doi = {10.1109/ted.2026.3658060},
  url = {https://arxiv.org/abs/2609.22509},
  note = {Source identifier: 2609.22509}
}