TY  - RPRT
TI  - Experiments and Modeling of Defect Dynamics and BTI Behavior in Doped InO TFTs during $400^\circ$C Post-Processing Forming Gas Annealing
AU  - Yu-Hsin Kuo
AU  - Chengyang Zhang
AU  - Priyankka Ravikumar
AU  - Sanghyun Kang
AU  - Taeyoung Song
AU  - Marco Villena
AU  - Luca Larcher
AU  - Hwan Kim
AU  - Minji Hong
AU  - Pilsang Yun
AU  - Gaurav Thareja
AU  - Shimeng Yu
AU  - Daewon Ha
AU  - Suman Datta
AU  - Julia Medvedeva
AU  - Asif Khan
PY  - 2026
DO  - 10.1109/ted.2026.3658060
UR  - https://arxiv.org/abs/2609.22509
ID  - 2609.22509
ER  -