@misc{indiciaeb82198a239fe,
  title = {Industrial Anomaly Detection via Defect-Grounded Reasoning in Visual Latent Space},
  author = {Jaron Yeh and Yen-Wei Chang and Jiang Liu and Shao-Yuan Lo},
  year = {2026},
  url = {https://arxiv.org/abs/2609.29457},
  note = {Source identifier: 2609.29457}
}