TY  - RPRT
TI  - Industrial Anomaly Detection via Defect-Grounded Reasoning in Visual Latent Space
AU  - Jaron Yeh
AU  - Yen-Wei Chang
AU  - Jiang Liu
AU  - Shao-Yuan Lo
PY  - 2026
UR  - https://arxiv.org/abs/2609.29457
ID  - 2609.29457
ER  -