@misc{indiciae23680f1f4734,
  title = {Nanometer-scale operando electric field mapping in oxide junctions by correlative STEM-EBIC and 4D-STEM},
  author = {Yining Xie and Eoin Moynihan and Xingyao Li and Richard Beanland and Aditya Singh and Marin Alexe and Mingmin Yang and Ana Sanchez},
  year = {2026},
  url = {https://arxiv.org/abs/2609.34087},
  note = {Source identifier: 2609.34087}
}