TY  - RPRT
TI  - Operando Surface Probe Microscopy Reveals Electrochemical Origins of Reliability Variability in Hafnia Ferroelectrics
AU  - Anudeep Tullibilli
AU  - Kartick Biswas
AU  - Shubham Kumar Parate
AU  - Pavan Nukala
PY  - 2026
UR  - https://arxiv.org/abs/2609.37516
ID  - 2609.37516
ER  -