@misc{indiciaec12e7251c77a,
  title = {Determination of van der Waals thin film thickness via characteristic X-ray photon yield},
  author = {Guoshun Luo and Shichao Zhao and Xinyu Liu and Suguo Chen and Yue Wang and Ping Zhang and Zhigang Lu and Shaomeng Wang and Sunchao Huang and Yubin Gong},
  year = {2026},
  url = {https://arxiv.org/abs/2610.01309},
  note = {Source identifier: 2610.01309}
}