TY  - RPRT
TI  - HiLO: Towards Product-Level Graceful Degradation with a Quality-Aware, Load-Aware Control Framework
AU  - Knut Magne Risvik
AU  - Zhuowei Li
AU  - Nirupam Purushothama
AU  - Hunter Su
AU  - Greg Dunham
AU  - Yan Reznikov
PY  - 2026
UR  - https://arxiv.org/abs/2610.34844
ID  - 2610.34844
ER  -