TY  - RPRT
TI  - The Batch Size Can Be One: Test-Time Adaptation from Classifier Geometry
AU  - Jaeho Hwang
AU  - Yujin Oh
AU  - Juhyeon Shin
AU  - Juhye Lee
AU  - Sungroh Yoon
AU  - Uiwon Hwang
PY  - 2026
UR  - https://arxiv.org/abs/2610.36628
ID  - 2610.36628
ER  -