TY  - RPRT
TI  - Direct Observation of Electron Trapping States in SiO$_2$ by Constant-Final-State Photoelectron Yield Spectroscopy: Insights into the Electron-Transfer Model of Contact Electrification
AU  - Renjiro Shibuya
AU  - Manato Tateno
AU  - Runa Hoshikawa
AU  - Tomohiro Ishibashi
AU  - Hirohiko Fukagawa
AU  - Hisao Ishii
PY  - 2026
UR  - https://arxiv.org/abs/2610.39748
ID  - 2610.39748
ER  -