TY  - RPRT
TI  - Statistically Robust Characterization of Polaron and Bipolaron Intrinsic Traps in Amorphous Silica Reveals the Role of Network Flexibility in Electron Localisation
AU  - Robin Delhomme
AU  - Jonathon Cottom
AU  - Emilia Olsson
PY  - 2026
UR  - https://arxiv.org/abs/2611.04652
ID  - 2611.04652
ER  -