TY  - RPRT
TI  - Characteristic Relations of Type-III Intermittency in an Electronic Circuit
AU  - Chil-Min Kim
AU  - Geo-Su Yim
AU  - Jung-Wan Ryu
AU  - Young-Jai Park
PY  - 1998
DO  - 10.1103/physrevlett.80.5317
UR  - https://arxiv.org/abs/chao-dyn/9805014
ID  - chao-dyn/9805014
ER  -