TY  - RPRT
TI  - Near-Field Microwave Microscopy of Materials Properties
AU  - Steven M. Anlage
AU  - D. E. Steinhauer
AU  - B. J. Feenstra
AU  - C. P. Vlahacos
AU  - F. C. Wellstood
PY  - 2000
UR  - https://arxiv.org/abs/cond-mat/0001075
ID  - cond-mat/0001075
ER  -