TY  - RPRT
TI  - Critical behavior of thermopower and conductivity at the metal-insulator transition in high-mobility Si-MOSFET's
AU  - R. Fletcher
AU  - V. M. Pudalov
AU  - A. D. B. Radcliffe
AU  - C. Possanzini
PY  - 2000
UR  - https://arxiv.org/abs/cond-mat/0002436
ID  - cond-mat/0002436
ER  -