@misc{indiciae0c10619f67c5, title = {Interface charged impurity scattering in semiconductor MOSFETs and MODFETs: temperature dependent resistivity and 2D "metallic" behavior}, author = {S. Das Sarma and E. H. Hwang and Igor Zutic}, year = {2000}, doi = {10.1006/spmi.2000.0877}, url = {https://arxiv.org/abs/cond-mat/0003429}, note = {Source identifier: cond-mat/0003429} }