TY  - RPRT
TI  - Interface charged impurity scattering in semiconductor MOSFETs and MODFETs: temperature dependent resistivity and 2D "metallic" behavior
AU  - S. Das Sarma
AU  - E. H. Hwang
AU  - Igor Zutic
PY  - 2000
DO  - 10.1006/spmi.2000.0877
UR  - https://arxiv.org/abs/cond-mat/0003429
ID  - cond-mat/0003429
ER  -