TY  - RPRT
TI  - Ising films with surface defects
AU  - M. -C. Chung
AU  - M. Kaulke
AU  - I. Peschel
AU  - M. Pleimling
AU  - W. Selke
PY  - 2000
DO  - 10.1007/s100510070014
UR  - https://arxiv.org/abs/cond-mat/0007499
ID  - cond-mat/0007499
ER  -