TY  - RPRT
TI  - Theory and Experiment on the Surface Photovoltage Diffusion Length Measurement in Thin Silicon Wafers
AU  - A. Barhdadi
AU  - G. Cohen-Solal
PY  - 2000
UR  - https://arxiv.org/abs/cond-mat/0008344
ID  - cond-mat/0008344
ER  -