TY  - RPRT
TI  - Random Berry Phase Magnetoresistance as a Probe of Interface Roughness in Si MOSFETs
AU  - H. Mathur
AU  - Harold U. Baranger
PY  - 2000
DO  - 10.1103/physrevb.64.235325
UR  - https://arxiv.org/abs/cond-mat/0008375
ID  - cond-mat/0008375
ER  -