TY  - RPRT
TI  - Scaling Limits for the 2D Metal-Insulator Transition at B = 0 in Si-MOSFETs
AU  - D. Lilliehook
AU  - J. E. Furneaux
PY  - 2000
UR  - https://arxiv.org/abs/cond-mat/0009366
ID  - cond-mat/0009366
ER  -