TY  - RPRT
TI  - High-Resolution X-Ray Reflectivity Study of Thin Layered Pt-Electrodes for Integrated Ferroelectric Devices
AU  - M. Aspelmeyer
AU  - U. Klemradt
AU  - W. Hartner
AU  - H. Bachhofer
AU  - G. Schindler
PY  - 2000
UR  - https://arxiv.org/abs/cond-mat/0010467
ID  - cond-mat/0010467
ER  -