@misc{indiciae9015b7046a67,
  title = {Nature of traps responsible for failure of MOS devices},
  author = {V. A. Gritsenko and P. M. Lenahan and Yu. N. Morokov and Yu. N. Novikov},
  year = {2000},
  url = {https://arxiv.org/abs/cond-mat/0011241},
  note = {Source identifier: cond-mat/0011241}
}